News

August 2018

17 August 2018
SEMICON Taiwan 2018

FORM attended SEMICON Taiwan in Taipei, the premier event in Taiwan for microelectronics manufacturing

June 2018

28 June 2018
Nepcon Thailand 2018 Expo in Bangkok, 20-23 June

We have just returned from attending the Nepcon Thailand 2018 Expo in Bangkok

March 2018

19 March 2018
FORM participated in exhibition Electronica China 2018, Shanghai

From the opening and to the latest working hour of the exhibition we had non-stop meetings at our booth - we negotiated with representatives of more than 100 Chinese companies

February 2018

27 February 2018
FORM WILL PARTICIPATE IN THE CONFERENCE «CERTIFICATION OF ECB-2018» 18-20 APRIL IN SAINT-PETERSBURG

FORM took part in the International Scientific and Technical Conference «Ways to solve the problems of providing modern electronic equipment with a reliable electronic component base»

December 2017

01 December 2017
SEMICON Japan, December 14-16 in Tokyo

For the first time leading test equipment supplier on the Russian market FORM company exhibited wide range of test solutions at Semicon Japan trade show, Tokyo Big Sight in Japan

November 2017

07 November 2017
SEMICON Europe 2017

We thank all our guests for taking time to visit our booth at SEMICON Europe, held in Munich, Germany from November 14th to 17th 2017

June 2017

21 June 2017
Trademark registration of branded Test solutions – TestBox

Each TestBox is a fully packaged product that transforms the FORMULA Test System into a ready workstation for measurement of electronic components

May 2017

25 May 2017
We are glad to inform you about the replenishment of our library of readyTest solutions - TestBox

The use of ready-made Test Solutions will immediately begin to measure new types of ECB, eliminating the costs of independent development of measuring equipment and monitoring programs, their manufacture, testing and correction

April 2017

03 April 2017
Participation in the exhibition ElectronTechExpo, 25-27 April 2017

We introduced the guests to our new model of the semiconductor Test Systems - FORMULA TT3

March 2017

22 March 2017
THE CONFERENCE «CERTIFICATION OF ECB-2017»

FORM representatives took part in the practical conference «Ways to solve the problems of providing modern electronic equipment with a reliable electronic component base»