News
November 2017
SEMICON Europe 2017
We thank all our guests for taking time to visit our booth at SEMICON Europe, held in Munich, Germany from November 14th to 17th 2017
June 2017
Trademark registration of branded Test solutions – TestBox
Each TestBox is a fully packaged product that transforms the FORMULA Test System into a ready workstation for measurement of electronic components
May 2017
We are glad to inform you about the replenishment of our library of readyTest solutions - TestBox
The use of ready-made Test Solutions will immediately begin to measure new types of ECB, eliminating the costs of independent development of measuring equipment and monitoring programs, their manufacture, testing and correction
April 2017
Participation in the exhibition ElectronTechExpo, 25-27 April 2017
We introduced the guests to our new model of the semiconductor Test Systems - FORMULA TT3
March 2017
THE CONFERENCE «CERTIFICATION OF ECB-2017»
FORM representatives took part in the practical conference «Ways to solve the problems of providing modern electronic equipment with a reliable electronic component base»
November 2016
We draw your attention to our new development: FORMULA SD Test System
The FORMULA SD Test System is a universal testing and measuring system designed for comprehensive automated verification of the static and dynamic parameters of semiconductor devices
Updated line of contacting devices
Contacting devices were developed by specialists of our Company in place of earlier used third-party products
May 2016
The «firmware» speed is increased on the FORMULA HF Ultra
Now initial initialization of the most highly integrated FPGAs, such as STRATIX4, f. ALTERA, can be performed on the FORMULA HF Ultra Test System via the «STAPL Player» in just 22 seconds without using the bytblaster and CAD Quartus
April 2016
MetrolExpo 2016
At the 12th MetrolExpo - 2016 metrology and metrological exhibition we presented an innovative product - the Incoming inspection laboratory iLForm
March 2016
The Laboratory of incoming inspection exhibition
Leading magazine «Sovremennaya Elektronika»
Leading magazine «Sovremennaya Elektronika» for specialists and managers of enterprises engaged in the development and production of electronic equipment, presented an article in the issue No. 3 of 2016 «On the Russian measuring device for the parameters of semiconductors - FORMULA TT2»