News
March 2018
FORM participated in exhibition Electronica China 2018, Shanghai
From the opening and to the latest working hour of the exhibition we had non-stop meetings at our booth - we negotiated with representatives of more than 100 Chinese companies
February 2018
FORM WILL PARTICIPATE IN THE CONFERENCE «CERTIFICATION OF ECB-2018» 18-20 APRIL IN SAINT-PETERSBURG
FORM took part in the International Scientific and Technical Conference «Ways to solve the problems of providing modern electronic equipment with a reliable electronic component base»
December 2017
SEMICON Japan, December 14-16 in Tokyo
For the first time leading test equipment supplier on the Russian market FORM company exhibited wide range of test solutions at Semicon Japan trade show, Tokyo Big Sight in Japan
November 2017
SEMICON Europe 2017
We thank all our guests for taking time to visit our booth at SEMICON Europe, held in Munich, Germany from November 14th to 17th 2017
June 2017
Trademark registration of branded Test solutions – TestBox
Each TestBox is a fully packaged product that transforms the FORMULA Test System into a ready workstation for measurement of electronic components
May 2017
We are glad to inform you about the replenishment of our library of readyTest solutions - TestBox
The use of ready-made Test Solutions will immediately begin to measure new types of ECB, eliminating the costs of independent development of measuring equipment and monitoring programs, their manufacture, testing and correction
April 2017
Participation in the exhibition ElectronTechExpo, 25-27 April 2017
We introduced the guests to our new model of the semiconductor Test Systems - FORMULA TT3
March 2017
THE CONFERENCE «CERTIFICATION OF ECB-2017»
FORM representatives took part in the practical conference «Ways to solve the problems of providing modern electronic equipment with a reliable electronic component base»
November 2016
We draw your attention to our new development: FORMULA SD Test System
The FORMULA SD Test System is a universal testing and measuring system designed for comprehensive automated verification of the static and dynamic parameters of semiconductor devices
Updated line of contacting devices
Contacting devices were developed by specialists of our Company in place of earlier used third-party products
May 2016
The «firmware» speed is increased on the FORMULA HF Ultra
Now initial initialization of the most highly integrated FPGAs, such as STRATIX4, f. ALTERA, can be performed on the FORMULA HF Ultra Test System via the «STAPL Player» in just 22 seconds without using the bytblaster and CAD Quartus