Новости

May 2018

11 May 2018
Information system Kamchatka is put on the register of Rospatent

Information system of traceability for control automation of electronic components life cycle Kamchatka is put on the register of the computer programs of Federal Institute of Industrial Property

April 2018

02 April 2018
MARCH 28, THE ANNUAL SEMINAR WAS HELD IN SKOLKOVO INNOVATION CENTER

We thank the participants of our annual seminar «Modern instruments for monitoring and research of high-frequency VLSI», which took place in the territory of the Skolkovo Innovation Center

March 2018

22 March 2018
ElectronTechExpo 2018, 17 - 19 april

Our specialists demonstrated solutions and advantages of our Test Systems for design centers, serial production of electronic component base, as well as incoming inspection for end users

19 March 2018
FORM participated in exhibition Electronica China 2018, Shanghai

From the opening and to the latest working hour of the exhibition we had non-stop meetings at our booth - we negotiated with representatives of more than 100 Chinese companies

01 March 2018
February 15, a practical seminar was held in Skolkovo Innovation Center

In order to develop cooperation between FORM and Dipol was held a practical seminar for the specialists of Dipol, in the territory of our incoming inspection laboratory ILFORM

February 2018

27 February 2018
FORM WILL PARTICIPATE IN THE CONFERENCE «CERTIFICATION OF ECB-2018» 18-20 APRIL IN SAINT-PETERSBURG

FORM took part in the International Scientific and Technical Conference «Ways to solve the problems of providing modern electronic equipment with a reliable electronic component base»

December 2017

01 December 2017
SEMICON Japan, December 14-16 in Tokyo

For the first time leading test equipment supplier on the Russian market FORM company exhibited wide range of test solutions at Semicon Japan trade show, Tokyo Big Sight in Japan

November 2017

07 November 2017
SEMICON Europe 2017

We thank all our guests for taking time to visit our booth at SEMICON Europe, held in Munich, Germany from November 14th to 17th 2017

July 2017

13 July 2017
SEMINAR «MODERN INSTRUMENTS FOR CONTROL AND RESEARCH OF HIGH-FREQUENCY VLSI»

Participants of the seminar shared their successful experience in developing of Test Solutions - TestBox for the FORMULA HF Test Systems and demonstrated them in work on the VLSI, static and dynamic memory Test System - FORMULA HF3


June 2017

21 June 2017
Trademark registration of branded Test solutions – TestBox

Each TestBox is a fully packaged product that transforms the FORMULA Test System into a ready workstation for measurement of electronic components

May 2017

25 May 2017
We are glad to inform you about the replenishment of our library of readyTest solutions - TestBox

The use of ready-made Test Solutions will immediately begin to measure new types of ECB, eliminating the costs of independent development of measuring equipment and monitoring programs, their manufacture, testing and correction