Training programs for diagnostics and calibration of Test systems are developed to reduce the ATE downtime, because of its failure or sending for maintenance and calibration on the territory of the Manufacturer. The knowledge gained during the training program will allow you to master the skills of metrological certification of equipment, and the issued certificates will entitle you to open the Test system unit without loss of warranty, localize defects accurate “to board”, remove the faulty component for replacement or sending it for repair (in the presence of spare parts, technical capabilities and coordination of work with the Manufacturer).
Depending on the chosen program, you will be able to master the basic techniques of working with equipment, acquire in-depth skills in developing of test programs and test fixture using ATE integrated software tools, and learn skills in calibrating Test systems and localizing faults.
Kindly note that specialists sent to the personnel training on rules for FORMULA 2K and FORMULA HF Test systems should have a good understanding of the physics and logic of DUT from Test system application field, be well informed about specifications for these DUT and have general ideas about programming in high-level test language. Based on the results of the training program, you will be given the appropriate certificate for the right to operate ATE.
To obtain maximum result, all our training programs are held individually and are suitable for a group of 2-3 attendees.
We invite you to acquaint yourself with the list of training programs and choose the one you are interested in.
|Title of training program||Number of
|1||Training programs for diagnostics and calibration of FORMULA Test systems|
|1.1||Diagnostics and calibration of VLSI Test systems FORMULA HF training program||16 h.|
|1.2||Diagnostics and calibration of LSI and IC Test systems FORMULA 2К training program||10 h.|
|1.3||Diagnostics and calibration of semiconductor Test systems FORMULA TT2 training program||10 h.|
|1.4||Diagnostics and calibration of low-current DC electromagnetic relays Test systems FORMULA R training program||12 h.|
|2||Training programs for Test systems FORMULA operation|
|VLSI Test systems FORMULA HF3/HF3-512 training program:|
|2.1||Standard program (Test systems operation basic skills, operational documentation review, development of test program through the example of generic VLSI and memory chip)||24 h.|
|2.2||Extended program (development of test program practical training in accordance with the specifications through the example of generic VLSI and memory chip)||40 h.|
|LSI and IC Test system FORMULA 2K training program:|
|2.3||Express program (Test systems operation basic skills, operational documentation review)||8 h.|
|2.4||Standard program (development of test program basic skills in accordance with the specifications through the example of digital ICs)||16 h.|
|2.5||Extended program (development of test program practical training in accordance with the specifications through the example of digital, analog and mixed-signal circuit)||32 h.|
|2.6||Development of test program on LSI and IC Test systems FORMULA 2K training program||24 h.|
|2.7||Training program on operation with control module of memory chip (RAM) LSI and IC Test systems FORMULA 2K||16 h.|
|Semiconductor Test systems FORMULA TT2 training program:|
|2.8||Training program on operation with semiconductor Test systems FORMULA TT2 (standard course)||10 h.|
|2.9||Development of test program on semiconductor Test systems FORMULA TT2 training program||12 h.|
|Low-current electromagnetic relays Test system FORMULA R training program:|
|2.10||Training program on operation with low-current electromagnetic relays FORMULA R (standard)||8 h.|
|Board Test system FORMULA CK training program:|
|2.11||Training program on operation with board Test system FORMULA CK (standard)||16 h.|